Scanning Electron Microscopy

Scanning Electron Microscopy

- In electron microscopes (EM) the images are formed by the interaction of electrons with the object.
- In scanning electron microscopes (SEM) the sample is scanned with a focused beam of electrons.
- Surface images with a high depth of field are characteristic.
- Usual resolutions: 1-30nm (depending on the instrument). Current limitation ca. 0.4 nm.
- Usual magnifications: 10 - 300.000x

  • Click here to view our slide show "Scanning electron microscopy"


  • Usual options:
    - Detection of backscattered or secondary electrons.
    - Elemental analysis by EDX (energy dispersive X-ray spectroscopy)

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